Abstract
Conductors consisting of thin layers are commonly used in many industries as protective, insulating or thermal barrier coatings (TBC). Nondestructive testing of these types of structures allows one to determine their dimensions and technical condition, while also detecting defects, which significantly reduces the risk of failures and accidents. This work presents an eddy current system for testing thin layers and coatings, which has never been presented before. It consists of an analytical model and a pot-core sensor. The analytical model was derived through the employment of the truncated region eigenfunction expansion (TREE) method. The final formulas for the sensor impedance have been presented in a closed form and implemented in Matlab. The results of the calculations of the pot-core sensor impedance for thin layers with a thickness above 0.1 mm were compared with the measurement results. The calculations made for the TBC were verified with a numerical model created using the finite element method (FEM) in Comsol Multiphysics. In all the cases, the error in determining changes in the components of the pot-core sensor impedance was less than 4%. At the same time, it was shown that the sensitivity of the applied pot-core sensor in the case of thin-layer testing is much higher than the sensitivity of the air-core sensor and the I-core sensor.