日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Tantalum-doped tin oxide thin films using hollow cathode gas flow sputtering technology

采用空心阴极气体流动溅射技术制备钽掺杂氧化锡薄膜

Huo, Fangfang; Muydinov, Ruslan; Seibertz, Bertwin Bilgrim Otto; Wang, Can; Hartig, Manuel; Alktash, Nivin; Gao, Peng; Szyszka, Bernd

Protocol for depositing transparent conductive Ta-doped SnO(2) film by hollow cathode gas flow sputtering technology

采用空心阴极气体流动溅射技术沉积透明导电Ta掺杂SnO(2)薄膜的方案

Huo, Fangfang; Hartig, Manuel; Otto Seibertz, Bertwin Bilgrim; Alktash, Nivin; Muydninov, Ruslan; Wang, Can; Gao, Peng; Szyszka, Bernd