Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS
凡尔赛先进材料和标准项目实验室间研究使用 XPS 和 LEIS 测量纳米颗粒涂层的厚度和化学性质
期刊:Journal of Physical Chemistry C
影响因子:
doi:10.1021/acs.jpcc.6b06713
Natalie A Belsey, David J H Cant, Caterina Minelli, Joyce R Araujo, Bernd Bock, Philipp Brüner, David G Castner, Giacomo Ceccone, Jonathan D P Counsell, Paul M Dietrich, Mark H Engelhard, Sarah Fearn, Carlos E Galhardo, Henryk Kalbe, Jeong Won Kim, Luis Lartundo-Rojas, Henry S Luftman, Tim S Nunney,