Synthesis-Related Nanoscale Defects in Mo-Based Janus Monolayers Revealed by Cross-Correlated AFM and TERS Imaging
利用交叉关联原子力显微镜和TERS成像技术揭示钼基Janus单层中与合成相关的纳米级缺陷
期刊:Small
影响因子:12.1
doi:10.1002/smll.202504742
Zhang, Tianyi; Krayev, Andrey; Yang, Tilo H; Mao, Nannan; Hoang, Lauren; Wang, Zhien; Liu, Hongwei; Peng, Yu-Ren; Zhu, Yunyue; Zheng, Xudong; Isotta, Eleonora; Kira, Maria E; Righi, Ariete; Pimenta, Marcos A; Chueh, Yu-Lun; Pop, Eric; Mannix, Andrew J; Kong, Jing