Understanding metric-related pitfalls in image analysis validation
了解图像分析验证中与指标相关的陷阱
期刊:Nature Methods
影响因子:32.1
doi:10.1038/s41592-023-02150-0
Reinke, Annika; Tizabi, Minu D; Baumgartner, Michael; Eisenmann, Matthias; Heckmann-Nötzel, Doreen; Kavur, A Emre; Rädsch, Tim; Sudre, Carole H; Acion, Laura; Antonelli, Michela; Arbel, Tal; Bakas, Spyridon; Benis, Arriel; Buettner, Florian; Cardoso, M Jorge; Cheplygina, Veronika; Chen, Jianxu; Christodoulou, Evangelia; Cimini, Beth A; Farahani, Keyvan; Ferrer, Luciana; Galdran, Adrian; van Ginneken, Bram; Glocker, Ben; Godau, Patrick; Hashimoto, Daniel A; Hoffman, Michael M; Huisman, Merel; Isensee, Fabian; Jannin, Pierre; Kahn, Charles E; Kainmueller, Dagmar; Kainz, Bernhard; Karargyris, Alexandros; Kleesiek, Jens; Kofler, Florian; Kooi, Thijs; Kopp-Schneider, Annette; Kozubek, Michal; Kreshuk, Anna; Kurc, Tahsin; Landman, Bennett A; Litjens, Geert; Madani, Amin; Maier-Hein, Klaus; Martel, Anne L; Meijering, Erik; Menze, Bjoern; Moons, Karel G M; Müller, Henning; Nichyporuk, Brennan; Nickel, Felix; Petersen, Jens; Rafelski, Susanne M; Rajpoot, Nasir; Reyes, Mauricio; Riegler, Michael A; Rieke, Nicola; Saez-Rodriguez, Julio; Sánchez, Clara I; Shetty, Shravya; Summers, Ronald M; Taha, Abdel A; Tiulpin, Aleksei; Tsaftaris, Sotirios A; Van Calster, Ben; Varoquaux, Gaël; Yaniv, Ziv R; Jäger, Paul F; Maier-Hein, Lena