日期:
2020 年 — 2026 年
2020
2021
2022
2023
2024
2025
2026
影响因子:

Electron-beam patterned calibration structures for structured illumination microscopy

用于结构照明显微镜的电子束图案化校准结构

Sangeetha Hari, Johan A Slotman, Yoram Vos, Christian Floris, Wiggert A van Cappellen, C W Hagen, Sjoerd Stallinga, Adriaan B Houtsmuller, Jacob P Hoogenboom

Structured illumination microscopy with noise-controlled image reconstructions

具有噪声控制图像重建的结构照明显微镜

Carlas S Smith, Johan A Slotman, Lothar Schermelleh, Nadya Chakrova, Sangeetha Hari, Yoram Vos, Cornelis W Hagen, Marcel Müller, Wiggert van Cappellen, Adriaan B Houtsmuller, Jacob P Hoogenboom, Sjoerd Stallinga

Detecting structural heterogeneity in single-molecule localization microscopy data

检测单分子定位显微镜数据中的结构异质性

Teun A P M Huijben #, Hamidreza Heydarian #, Alexander Auer, Florian Schueder, Ralf Jungmann, Sjoerd Stallinga, Bernd Rieger

3D particle averaging and detection of macromolecular symmetry in localization microscopy

定位显微镜中的 3D 粒子平均和大分子对称性检测

Hamidreza Heydarian, Maarten Joosten, Adrian Przybylski, Florian Schueder, Ralf Jungmann, Ben van Werkhoven, Jan Keller-Findeisen, Jonas Ries, Sjoerd Stallinga, Mark Bates, Bernd Rieger

Quantitative localization microscopy: effects of photophysics and labeling stoichiometry

定量定位显微镜:光物理和标记化学计量学的影响

Robert P J Nieuwenhuizen, Mark Bates, Anna Szymborska, Keith A Lidke, Bernd Rieger, Sjoerd Stallinga

Resolution improvement by 3D particle averaging in localization microscopy

定位显微镜中通过 3D 粒子平均提高分辨率

Jordi Broeken, Hannah Johnson, Diane S Lidke, Sheng Liu, Robert P J Nieuwenhuizen, Sjoerd Stallinga, Keith A Lidke, Bernd Rieger

Re-scan confocal microscopy: scanning twice for better resolution

重新扫描共聚焦显微镜:扫描两次以获得更好的分辨率

Giulia M R De Luca, Ronald M P Breedijk, Rick A J Brandt, Christiaan H C Zeelenberg, Babette E de Jong, Wendy Timmermans, Leila Nahidi Azar, Ron A Hoebe, Sjoerd Stallinga, Erik M M Manders